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This system enables defect inspection and measurement of various films used in secondary battery such as positive/negative electrode, collective electrode, insulating separator and lamination film for packaging.
※Press the aimed button to display detail.
Our system inspects film running in very high speed with the top level resolution of the industry.
<Inspection Speed vs. Resolution>
Ex. Line Speed: 300m/min⇒Resolution: 150μm~
<Target Defects>
Combination of special lighting and processing ensuring detection of micro defects like pinhole and foreign particle as well as large defect such as membrane defect like streak.
Also makes easier to discriminate pinhole and non-penetrated clear defect on the seperator.
Ex. Line Speed: 100m/min⇒Resolution: 50μm~
《Target Defects》
Our inspection system enables to detect low-contract defects like pinholes and particle incorporated in thin lamination layer.
《Line Speed vs. Resolution》
Ex. Line Speed: 100m/min⇒Resolution: 50μm~
《Target Defects》
Foreign particle, Pinhole, Stripe, Mura (Irregularity), etc.
Available of inspection and measuring in electrode production process as shown below.
《Defect Inspection》
1.Coincidental detection of micro defects (e.g. foreign particle, pinhole) and application failure (e.g. stripe, mura)
2.High-precision inspection at the level of highest speed in the industry
Application line speed: 50m/min⇒Inspection resolution: 25μm~
Slitting line speed: 100m/min⇒Inspection resolution: 50μm~
3.Coincidental inspection of applied area and unapplied area, with the least margin on boundary
Measurement of application width and length together with inspection
Compatible both of stripe application and intermittent application
