FPD

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AFM

AFM

This is a 3D measuring machine applicable to surface film thickness measurement. Original wide range scanner ensures wide view measurement as wide as 700μm. We have only developed Inline AFM compatible with large glass for FPD, which are used in many FPD manufacturers.
AFM

Features

・Lineup covering universal model for test and analysis to a model having a large stage
 Full automatic measurement available without damage to large glass
 Simplified manual model good for analysis of wafer and specimen, which is available with reasonable price
・Equipped with high rigidity, soundproof design and high-performance active antivibration stage, which are compatible
 with LD/ULD, automatic multi-point measurement and inline measurement
・Wide range scanner with 700μm view ensuring simultaneous measurement of all RGB pixels, ideal for monitoring
 general view and inter-pixel step without distortion or stitching
・Up/Down Mode moving a new probe vertically, good for the measurement of trench depth
・Easy operation with registration of measuring coordinates, parameters and data analysis to recipe

Specifications

  AS-7B-AUTO AS-7B-μX
Measurement Mode Contact AFM, AC-AFM, Up/Down Mode, Phase Image (Option)
XY Scanner Wide Range Scanner: 220x220, 440x440, 700x700m
Built-in Closed Loop Sensor
High-resolution Scanner: 30x30m
Z Scanner 15m Stroke, Equipped with Displacement Sensor
Horizontal Distortion Canceling Control
Reproducibility 3σ≦1nm
Measurement Time 45s/point (1D measurement)
Optical Microscope Power Zoom/Focus, x98-x685 14” Monitor
Cantilever Premount Attachment Type,
Manufacturer: Olympus, Nanoworld, NonoTools (HDC), CNT Probe etc.
Stage Size Max. 2,200x2,500mm
Linear Motor Stage
Standard 150x150mm
Pulse Motor Stage
Antivibration Standard Active Antivibration Stage Passive or Active Antivibration Stage

Measurement Examples

Measurement Examples

Contact

FPD

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