A method other than existing detection methods has been introduced and a theory specialized in crack detection has been used to realize full automatic solar cell inspection.

The same detection method as for the above ALIS-C is used to realize automatic detection of micro cracks for strings circuit for solar cell module.

Micro-cracks and non-penetrated cracks are clearly detected without any influence of crystal grain on polycryctal silicon wafer.
Compatible with monocrystal wafer