Secondary Battey Film Material: Inspection/Measurement

This system enables defect inspection and measurement of various films used in secondary battery such as positive/negative electrode, collective electrode, insulating separator and lamination film for packaging.

Collective Electrode Inspection

Our system inspects film running in very high speed with the top level resolution of the industry.

Inspection Speed vs. Resolution

Ex. Line Speed: 300m/min⇒Resolution: 150μm～

Target Defects

Scratch, Foreign particle, Stripe, Stain, etc.

Separator Inspection

Combination of special lighting and processing ensuring detection of micro defects like pinhole and foreign particle as well as large defect such as membrane defect like streak.
Also makes easier to discriminate pinhole and non-penetrated clear defect on the seperator.

Line Speed vs. Resolution

Ex. Line Speed: 100m/min⇒Resolution: 50μm～

Target Defects

Foreign particle, Pinhole, Stripe, Mura (Irregularity), etc.

Laminate Film Inspection

Our inspection system enables to detect low-contract defects like pinholes and particle incorporated in thin lamination layer.

Line Speed vs. Resolution

Ex. Line Speed: 100m/min⇒Resolution: 50μm～

Target Defects

Foreign particle, Pinhole, Stripe, Mura (Irregularity), etc.

Electorode Inspection

Available of inspection and measuring in electrode production process as shown below.

Defect Inspection

• Coincidental detection of micro defects (e.g. foreign particle, pinhole) and application failure (e.g. stripe, mura)
• High-precision inspection at the level of highest speed in the industry
  Application line speed: 50m/min⇒Inspection resolution: 25μm～
  Slitting line speed: 100m/min⇒Inspection resolution: 50μm～
• Coincidental inspection of applied area and unapplied area, with the least margin on boundary

Measurement Function

Measurement of application width and length together with inspection
Compatible both of stripe application and intermittent application

Target Defects (after application/slitting)

Foreign particle, Pinhole, Scratch, Stain, etc.

Measurement Function

Related technical information

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