Question 1

What is the Image Processing Division of TAKANO CO., LTD.?

Accepted Answer

Since 1987, the Image Processing Division of TAKANO CO., LTD. has been a comprehensive manufacturer of visual inspection systems. We develop, manufacture and sell inspection and measurement systems for semiconductors, films and flat panel displays, with more than 4,500 systems installed worldwide. Based at the Minamidaira Plant in Nagano Prefecture, we also operate the Tokyo Sales Office, Yokohama Technology Center, Hakodate Office, Saitama Office, Shizuoka Office and Oita CS Center, together with group companies in Taiwan, Shanghai and the United States.

Question 2

What kinds of inspection and measurement systems do you offer?

Accepted Answer

We cover four main fields. (1) Semiconductors: Front-End, Back-End and Packaging Inspection Systems, Inspection Systems for Material and Equipment Manufacturers, and the PSL Calibration Wafer. (2) Film inspection: ultra high-speed, high-resolution visual inspection of films with the HAWKEYES Series (ONE/ELITE/PATTERN). (3) Flat panel inspection: the High-Precision Inspection System and the Mura/Film Thickness Inspection System for LCD, OLED and touch panels. (4) Glass Substrate for AP: the Vi Series, ALTAX Series, Thinspector and more.

Question 3

What are Takano's strengths?

Accepted Answer

We have three strengths. First, a proven track record: about 40 years of experience and more than 4,500 systems installed worldwide. Second, problem-solving capability: experienced engineers, in-house optical and image processing technologies and the latest AI technology allow us to customize systems, and our in-house evaluation environment lets us verify performance on actual equipment. Third, comprehensive support: we continue to support maintenance and operational improvements after installation.

Question 4

What is a visual inspection system?

Accepted Answer

A visual inspection system captures images of the surface of products or components with cameras and sensors and uses image processing to automatically detect defects such as scratches, particles, pattern defects and mura. Compared with manual visual inspection, it enables faster, more accurate and more consistent quality control, and it is widely used on production lines for semiconductor wafers, films and flat panel displays. At Takano, we develop everything in-house, from the optics to the software.

Question 5

What systems do you offer for semiconductor wafer inspection?

Accepted Answer

For front-end processes, we offer the Non-Patterned Wafer Inspection System (WM Series) and the Whole-Surface Film Thickness Inspection System (Thinspector). For back-end processes, we offer the Patterned Wafer Visual Macro Inspection System (Vi Series) and the Bump Height Inspection System (ALTAX Series), and for packaging, the ALTAX Series. We also offer the WM Series for material and equipment manufacturers, and the PSL Calibration Wafer for calibrating inspection systems.

Question 6

What are the features of the HAWKEYES film inspection series?

Accepted Answer

The HAWKEYES series consists of three models. HAWKEYES ONE is one of the fastest inspection systems in the industry, detecting and classifying minute defects in real time even on ultra high-speed production lines. HAWKEYES ELITE combines high-speed, high-resolution inspection with customizability to meet diverse requirements flexibly. HAWKEYES PATTERN uses a proprietary algorithm to inspect films patterned in roll-to-roll processes. The series supports a wide range of materials, including polarizing films, electronic materials and separators.

Question 7

How do you use AI technology?

Accepted Answer

Takano offers the Real-time AI Defect Classification System TAKANO AI. Defect classification, which used to require complex parameter settings, can now be performed easily and with high accuracy using AI. Real-time feedback on the inspection line improves classification accuracy and operational efficiency at the same time.

Question 8

Which industries and products can you inspect?

Accepted Answer

In semiconductors: CMOS, CPO, LiDAR, power devices, RF devices, MEMS, SAW filters and more. In films: polarizing films, diffusion films, MLCC, CCL, separators, metal foils and more. In flat panels: LCD, OLED, microdisplays, touch panels and more. We also support visual inspection of a wide variety of other products, such as CPUs, GPUs, LEDs and electrode sheets.

Question 9

What is the process for introducing an inspection system?

Accepted Answer

We proceed in six steps. (1) Consultation: we listen to your inspection challenges and requirements. (2) Evaluation: we evaluate your samples and verify performance on actual equipment in our in-house evaluation environment. (3) Proposal: we propose the optimal inspection solution. (4) Design and manufacturing: we design and build a system customized for your line. (5) Operation: we support delivery, installation and start-up. (6) After-sales service: we provide ongoing support for maintenance, upgrades and operational improvements.

Question 10

Do you have overseas locations?

Accepted Answer

Yes. We have three overseas group companies: TAKANO Co., Ltd. Taiwan (head office in Taichung and an office in Taoyuan), Takano Shanghai Trading Co., Ltd. in Shanghai, China, and Takano of America Inc. in Torrance, California, USA. Together they form our global support network.

Question 11

What are the technical features of 3D inspection with the ALTAX Series?

Accepted Answer

The ALTAX Series is a 3D inspection system that combines the light-section method, image processing technology and an ultra high-speed CMOS sensor. It measures bump height, diameter and coplanarity at high speed and high resolution, and can also inspect dents after via filling or plating. It achieves higher measurement accuracy than conventional light-section systems and enables 100% in-line inspection.

Question 12

How can I contact you for inquiries or support?

Accepted Answer

Please contact us online via our Contact page (https://www.takano-kensa.com/kensa/en/contact/). Phone inquiries are accepted on weekdays from 9:00 a.m. to 4:30 p.m. (JST). For FPD inspection systems, call +81-265-85-4080 (Minamidaira Plant); for wafer, film and other inspection systems, call +81-3-3253-8261 (Tokyo Sales Office).

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