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Exhibition at SEMICON Europa 2024, one of the world's largest semiconductor exhibitions, to be held from November 12th to 15th in München, Germany

November 6th,2024 exhibition

We are pleased to announce that we will be exhibiting at SEMICON Europa 2024, to be held at Messe München in München, Germany from November 12th (Tue) to 15th (Fri), 2024 (local time).

The exhibition is in collaboration with our exclusive distributor in Europe and America, ClassOne Equipment.

Exhibited Products

For the full-scale sales launch in Europe and America, we will be presenting our "WM Series" wafer surface inspection system, which has obtained overseas certifications. We anticipate increased domestic and international sales of this semiconductor surface inspection equipment.

Products on Display

Wafer Surface Inspection System - WM Series

  • Wafer Surface Inspection System: WM-7SR
  • Wafer Surface Inspection System: WM-10R

These inspection systems are essential for semiconductor device manufacturing, material development, and equipment management. They use semiconductor lasers as the light source, which reduces running costs. They are capable of detecting nano-level particles (foreign substances) and are widely used both domestically and internationally.

▼ Wafer Surface Inspection System (WM Series) Product Page

https://www.takano-kensa.com/kensa/products/semiconductor/wm/

Product Specifications

Major SpecificationWM-7SRWM-10R
Maximum Detection Sensitivity (Bare Si)0.079μm (0.061μm optional)0.048μm
Wafer Size2 inch ~ 8 inch4 inch ~ 12 inch
Throughput55 wph @ 8 inch, 60 wph @ 6 inch70 wph @ 12 inch
Dynamic Range0.079μm ~ 5.0μm0.048μm ~ 5.0μm
Device Size (mm)W860 × D900 × H1,650W1,480 × D1,230 × H1,960
Safety CertificationFDA, CE, SEMIFDA, CE, SEMI

SEMICON Europa Exhibition Details