Information
Exhibition Announcement: SEMICON Taiwan 2024
August 28th,2024 exhibition
We will be exhibiting at "SEMICON Taiwan 2024," which will be held from September 4 (Wednesday) to 6 (Friday), 2024, at the Taipei Nangang Exhibition Center, Halls 1 and 2 (Tainex) in Taiwan.
This time, we will be showcasing our semiconductor inspection equipment and visual inspection systems, targeting device manufacturers, foundries, equipment manufacturers, and material manufacturers. At Takano, we cover a wide range of inspection capabilities, from optical to laser inspection. We cordially invite you to visit our booth.
Exhibition Booth Image at SEMICON Taiwan 2024
Outline of SEMICON Taiwan 2024
| Event Schedule： | September 4 (Wednesday) to September 6 (Friday), 2024 |
| Event Time： | 10:00 AM to 5:00 PM (until 4:00 PM on the last day) (local time) |
| Event Location： | Taipei Nangang Exhibition Center Hall 1 and Hall 2 (Tainex), Taipei, Taiwan |
| Booth Number: | P5926 |
| Official Website： | https://www.semicontaiwan.org/ ▽Visitor Pre-registration Site: https://registration.semicontaiwan.org/visitor/index |
Exhibited Products
Wafer Surface Inspection Equipment WM Series
The inspection system is indispensable for the manufacturing of semiconductor devices, material development, and equipment management. It uses a semiconductor laser as the light source, which helps reduce running costs.
This system is capable of detecting nano-level particles (contaminants), and it has been widely used both domestically and internationally.
Our new product, WM-10R, has obtained international safety certifications and offers improved safety and quality compared to its predecessor, WM-10. The WM-10R will also be introduced at this exhibition.
▼ Wafer Surface Inspection Equipment (WM Series) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/wm/
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WM Series: WM-10R -
WM Series: WM-7SR
The inspection system is indispensable for the manufacturing of semiconductor devices, material development, and equipment management. It uses a semiconductor laser as the light source, which helps reduce running costs.
This system is capable of detecting nano-level particles (contaminants), and it has been widely used both domestically and internationally.
Our new product, WM-10R, has obtained international safety certifications and offers improved safety and quality compared to its predecessor, WM-10. The WM-10R will also be introduced at this exhibition.
▼ Wafer Surface Inspection Equipment (WM Series) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/wm/
Wafer Visual Inspection Equipment (Vi Series)
This equipment inspects the wiring patterns, cracks, and contaminations on wafers with high precision. We offer five different models based on wafer size, device type, defect type, and inspection speed.
▼ Wafer Visual Inspection Equipment (Vi Series) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/pattern/
This equipment inspects the wiring patterns, cracks, and contaminations on wafers with high precision. We offer five different models based on wafer size, device type, defect type, and inspection speed.
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Vi-4207 -
Vi-4307 -
Vi-5301
https://www.takano-kensa.com/kensa/products/semiconductor/pattern/
Micro Bump Inspection Equipment (ALTAX-300EX)
Micro Bump Inspection Equipment (ALTAX-300EX)
By using our own high-speed camera, we can inspect every micro bump with a diameter of up to 10μm and a pitch of up to 20μm at high speed.
▼ Micro Bump Inspection Equipment (ALTAX-300EX) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/altax-300ex/
Micro Bump Inspection Equipment (ALTAX-300EX)
By using our own high-speed camera, we can inspect every micro bump with a diameter of up to 10μm and a pitch of up to 20μm at high speed.
▼ Micro Bump Inspection Equipment (ALTAX-300EX) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/altax-300ex/
Full-Surface Film Uniformity Inspection Equipment (Thinspector)
Full-Surface Film Uniformity Inspection Equipment (Thinspector)
With a single scan, it can rapidly measure the film thickness and inspect for uniformity across the entire wafer, ensuring comprehensive film thickness management.
▼ Full-Surface Film Uniformity Inspection Equipment (Thinspector) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/thinspector/
Full-Surface Film Uniformity Inspection Equipment (Thinspector)
With a single scan, it can rapidly measure the film thickness and inspect for uniformity across the entire wafer, ensuring comprehensive film thickness management.
▼ Full-Surface Film Uniformity Inspection Equipment (Thinspector) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/thinspector/
Full-Surface Height Inspection Equipment for Packages (ALTAX)
Full-Surface Height Inspection Equipment for Packages (ALTAX)
This equipment measures the height, diameter, and coplanarity of bumps formed on semiconductor wafers, BGA, CSP, and other package substrates with high speed and precision using the new inspection unit "Mervel".
By adopting an improved optical system and data processing method (Time Delay Scanning), it achieves a level of precision not possible with traditional laser triangulation methods.
▼ Full-Surface Height Inspection Equipment for Packages (ALTAX) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/altax/
Full-Surface Height Inspection Equipment for Packages (ALTAX)
This equipment measures the height, diameter, and coplanarity of bumps formed on semiconductor wafers, BGA, CSP, and other package substrates with high speed and precision using the new inspection unit "Mervel".
By adopting an improved optical system and data processing method (Time Delay Scanning), it achieves a level of precision not possible with traditional laser triangulation methods.
▼ Full-Surface Height Inspection Equipment for Packages (ALTAX) Product Page
https://www.takano-kensa.com/kensa/products/semiconductor/altax/
Film Appearance Inspection System Hawkeyes Series
Plain High-Speed Micro Image Inspection System Hawkeyes one
The Hawkeyes series achieves high-speed and high-precision inspections for the high-functionality film market (optical, electronic materials, battery materials) by utilizing in-house developed cameras, image processing units, and inspection algorithms.
By adopting our in-house high-performance camera and newly developed image processing unit, we have achieved one of the industry's fastest inspection speeds (according to our research). The system allows for high-resolution settings to detect fine defects on high-speed production lines. It also enables the detection of various defects by parallelizing multiple processing tasks.
▼ Plain High-Speed Micro Image Inspection System Hawkeyes one Product Page
https://www.takano-kensa.com/kensa/products/film/one/
Plain High-Speed Micro Image Inspection System Hawkeyes one
The Hawkeyes series achieves high-speed and high-precision inspections for the high-functionality film market (optical, electronic materials, battery materials) by utilizing in-house developed cameras, image processing units, and inspection algorithms.
By adopting our in-house high-performance camera and newly developed image processing unit, we have achieved one of the industry's fastest inspection speeds (according to our research). The system allows for high-resolution settings to detect fine defects on high-speed production lines. It also enables the detection of various defects by parallelizing multiple processing tasks.
▼ Plain High-Speed Micro Image Inspection System Hawkeyes one Product Page
https://www.takano-kensa.com/kensa/products/film/one/
SEMICON Taiwan 2023 Highlights from Last Year