Plain Film Inspection System

Plain Film Inspection System HAWKEYES ELITE

HAWKEYES ELITE combines high-speed, high-definition inspection with customizability, flexibly addressing diverse requirements while contributing to enhanced productivity.
It utilizes our proprietary cameras developed to achieve industry-leading high-speed and high-definition performance.

Inspection Targets

  • Optical Films: Polarizing films, diffuser films, retardation films, anti-reflective films, etc.
  • Films for Electronic Materials: MLCC, CCL/FCCL, DFR, insulating films, adhesive films, release films, etc.
  • Energy-related Films: Separators, various metal foils, etc.
  • Base Films: TAC, PET, PI, etc.

Features

  • 01

    Flexible system configurations supporting various lines, from Roll-to-Roll to sheet-fed machines

    Our system, comprehensively tuned based on proprietary cameras and image processing units, contributes to your production lines.

    Line Speed Resolution
    100m/min 20 μm
    200m/min 40 μm
    Roll-to-Roll
    Offline
  • 02

    Detect multiple defects with Takano's original image processing technology

    By leveraging proprietary image processing technology and parallel processing multiple algorithms, HAWKEYES ensure reliable defect detection.

    Grayscale image processed image Detected image
    Black spot
    Mura
    Lines
    Lines
    Bump
    Dent
    Horizontal lines -
    Vertical
    lines
    -
  • 03

    Feature classification x AI automatic defect classification

    Achieve real-time defect classification even in high-speed inspections. Leveraging the sharp images captured by our proprietary cameras, Takano enable highly accurate defect classification without the need for complex settings.

For details on AI defect classification, click here

Specifications

Hardware

Effective Pixels 8,000 pixels, 16,000 pixels
Control & Statistics PC FA Specifications

Software

Defect Inspection Inspection judgment processing, noise reduction, spatial filter, defect map display
Data Viewing Defect List (Map/Coordinate Data), Defect Image Display, Trend Graph, Statistical Processing, etc.

*Customization available for screen display, feature additions, etc.

Examples of Inspection Target Defects

  • Hole Defect: coating voids, pinholes
  • Streak defects: Coating streaks, wrinkles, roll streaks, etc.
  • Unevenness defects: Foreign matter, scratches, bubbles, etc.
  • Mura defects: Coating Mura, crawling (cissing), etc.