Ultra High-Speed Plain Film Inspection System

Ultra High-Speed Plain Film Inspection System

An industry-leading inspection system that supports ultra-fast production lines! HAWKEYES ONE detects and classifies fine defects in real-time, significantly reducing the risk of defects escaping. Enhance quality control while boosting production efficiency!

Inspection Targets

  • Optical Films: Polarizing films, diffuser films, retardation films, anti-reflective films, etc.
  • Films for Electronic Materials: MLCC, CCL/FCCL, DFR, insulating films, adhesive films, release films, etc.
  • Energy-related Films: Separators, various metal foils, etc.
  • Base Films: TAC, PET, PI, etc.

Defect Detection Example

  • Black spot
  • Mura
  • Lines
  • Lines
  • Bump
  • Dent
  • Horizontal lines
  • Vertical
    lines

Features

  • 01

    Supports high-speed production lines

    Adoption of in-house cameras enables high-resolution settings
    for detecting minute defects on high-speed production lines.

    Line Speed Resolution
    50m/min 5 μm
    100m/min 10 μm
    200m/min 20 μm
    • In-house camera
    • Commercially available cameras

    *Resolution in the flow direction configurable against Line Speed

  • 02

    Versatile detection with multiple processing

    Newly developed image processing unit that supports a wide range of defect detection.

  • 03

    User-friendly application

    Emphasizes visibility and operability to improve operational efficiency.

    Main Screen
    • Recipe Screen
    • System Setting Screen
  • 04

    Feature classification x AI automatic defect classification

    Achieve real-time defect classification even in high-speed inspections. Leveraging the sharp images captured by our proprietary cameras, Takano enable highly accurate defect classification without the need for complex settings.

    For details on AI defect classification, click here

Specifications

Hardware

Effective Pixels 8,000 pixels, 16,000 pixels
PC FA Specifications

Software

Defect Inspection Inspection judgment processing, noise reduction, spatial filter, defect map display
Data Viewing Defect list (Map/Coordinate data), defect image display, trend graph, statistical processing, etc.

System Overview

Compatible with a wide range of optical systems! System specifications are tailored through detailed sample evaluation to meet customers specific needs.

Examples of Inspection Target Defects

  • Hole type: Coating skip, pinholes
  • Streak defects: Coating streaks, wrinkles, roll streaks, etc.
  • Unevenness defects: Foreign matter, scratches, bubbles, etc.
  • Mura defects: Coating Mura, crawling (cissing), etc.