Film Ultra High-Speed Plain Film Inspection System

Ultra High-Speed Plain Film Inspection System
An industry-leading inspection system that supports ultra-fast production lines! HAWKEYES ONE detects and classifies fine defects in real-time, significantly reducing the risk of defects escaping. Enhance quality control while boosting production efficiency!
Inspection Targets
- Optical Films: Polarizing films, diffuser films, retardation films, anti-reflective films, etc.
- Films for Electronic Materials: MLCC, CCL/FCCL, DFR, insulating films, adhesive films, release films, etc.
- Energy-related Films: Separators, various metal foils, etc.
- Base Films: TAC, PET, PI, etc.
Defect Detection Example
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Black spot -
Mura -
Lines -
Lines -
Bump -
Dent -
Horizontal lines -
Vertical
lines
Features
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Supports high-speed production lines
Adoption of in-house cameras enables high-resolution settings
for detecting minute defects on high-speed production lines.Line Speed Resolution 50m/min 5 μm 100m/min 10 μm 200m/min 20 μm -
In-house camera -
Commercially available cameras
*Resolution in the flow direction configurable against Line Speed
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Versatile detection with multiple processing
Newly developed image processing unit that supports a wide range of defect detection.
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User-friendly application
Emphasizes visibility and operability to improve operational efficiency.
Main Screen -
Recipe Screen -
System Setting Screen
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Feature classification x AI automatic defect classification
Achieve real-time defect classification even in high-speed inspections. Leveraging the sharp images captured by our proprietary cameras, Takano enable highly accurate defect classification without the need for complex settings.
Specifications
Hardware
| Effective Pixels | 8,000 pixels, 16,000 pixels |
|---|---|
| PC | FA Specifications |
Software
| Defect Inspection | Inspection judgment processing, noise reduction, spatial filter, defect map display |
|---|---|
| Data Viewing | Defect list (Map/Coordinate data), defect image display, trend graph, statistical processing, etc. |
System Overview
Compatible with a wide range of optical systems! System specifications are tailored through detailed sample evaluation to meet customers specific needs.

Examples of Inspection Target Defects
- Hole type: Coating skip, pinholes
- Streak defects: Coating streaks, wrinkles, roll streaks, etc.
- Unevenness defects: Foreign matter, scratches, bubbles, etc.
- Mura defects: Coating Mura, crawling (cissing), etc.

