Inspection Systems for Material and Equipment Manufacturers
About Inspection Systems for Materials and Equipment Manufactures
Optimal inspection systems for process control and outgoing quality control for substrate manufacture, such as compound semiconductors and process equipment manufactures.
Non-Patterned Wafer Inspection System
WM Series
WM Series enables highly sensitive detection of particles and defects on non-patterned wafer surface and is utilized in a wide range of process control applications.
Ultra High-Speed Plain Film Inspection System
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HAWKEYES ONE
An industry-leading inspection system that supports ultra-fast production lines! HAWKEYES detects and classifies fine defects in real-time, significantly reducing the risk of defects escaping.
Enhance quality control while boosting production efficiency!
Plain Film Inspection System
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HAWKEYES ELITE
Combining high-speed, high-definition inspection with unmatched customizability, delivering flexible solutions that adapt to your unique needs and drive greater productivity.
Patterned Film Inspection System
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HAWKEYES PATTERN
Inspects patterned films in the Roll-to-Roll process with unique algorithms and advanced image processing hardware.