Mura/Film Thickness Inspection System

About Mura/Film Thickness Inspection System

Mura/Film Thickness Inspection Equipment detects Mura defects occurring in the LCD production process.
Based on our extensive experience in the flat panel field, we have automated inspection processes that previously relied on operator visual inspection, detecting both streak-like and dot-like Mura defects.

Inspection Targets

  • Resist Coating Mura in CF Process
  • Resist Coating Mura in TFT Process
  • Resist Coating Mura in various processes, etc.

Defect Detection Example

  • Mura in OC Film
  • Mura in PI Film

And more.

Features

  • 01

    Achieves Mura Detection in Each Process

  • 02

    Capable of Detecting Defects Caused by Various Factors

Specifications

Imaging Method Line sensor camera
Illumination Method Transmitted illumination or reflected illumination
Light Source Used LED / Optical filter tailored to each process
Inspection Stage Conveyor transport *May require modification if installed on customer's existing conveyor.
Defect Detection Capability 1mm or larger in width
Example Tact Time Within 30sec/sheet (2200×2500mm)

Options

  • Equipped with Film Thickness Measurement Head

Application Example here